发明名称 SYSTEMS AND METHODS FOR MEASURING AND CHARACTERIZING INTERIOR SURFACES OF LUMINAL STRUCTURES
摘要 A digital topographic model of the luminal surface is generated by projecting an optical pattern on the luminal surface from the first location within the lumen. At least a portion of the projected pattern is detected from a second location within the lumen which is based apart from the first location. The dimensions of the luminal wall can be measured by triangulation in order to produce the digital topographic model of the body lumen.
申请公布号 WO2014179775(A1) 申请公布日期 2014.11.06
申请号 WO2014US36702 申请日期 2014.05.02
申请人 VS MEDTECH, INC. 发明人 STERN, ROGER, A.
分类号 A61B5/107 主分类号 A61B5/107
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