发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR MEMORY DEVICE
摘要 According to one embodiment, a manufacturing method of a semiconductor memory device includes forming a stacked body in which word line material layers and insulating layers are alternately stacked on a base layer. The method includes forming first holes on the stacked body so as to be arranged in a first direction and in a second direction that intersects with the first direction. The method includes forming resistance-change films on inner walls of the first holes, forming bit lines inside the resistance-change films in the first holes, and dividing the stacked body in the first direction by forming second holes so that a portion in the stacked body adjacent to the resistance-change films in the second direction. The method includes forming inter-bit line insulating films in the second holes.
申请公布号 US2014326939(A1) 申请公布日期 2014.11.06
申请号 US201314023865 申请日期 2013.09.11
申请人 Kabushiki Kaisha Toshiba 发明人 YAMATO Masaki;Yamaguchi Takeshi;Kobayashi Shigeki
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A manufacturing method of a semiconductor memory device, comprising: forming a stacked body in which word line material layers and insulating layers are alternately stacked on a base layer; forming first holes on the stacked body so as to be arranged in a first direction and in a second direction that intersects with the first direction; forming resistance-change films on inner walls of the first holes; forming bit lines inside the resistance-change films in the first holes; dividing the stacked body in the first direction by forming second holes so that a portion in the stacked body adjacent to the resistance-change films in the second direction; and forming inter-bit line insulating films in the second holes.
地址 Minato-ku JP