发明名称 DETERMINING THE SIGNAL QUALITY OF AN ELECTRICAL INTERCONNECT
摘要 One embodiment provides a network device that includes PHY circuitry comprising transmit circuitry (Tx) and receive circuitry (Rx), wherein the Tx and Rx circuitry are configured to be coupled to a respective channel to communicate with an external device via the channels, wherein the network device configured to communicate with the external device using an Ethernet communications protocol; and test circuitry. The test circuitry is configured to: designate a through channel and at least one crosstalk channel from among the channels; determine, in the time domain, an approximate available signal voltage of a first response signal, wherein the first response signal is in response to a test signal applied to the through channel; determine a first noise profile of the first response signal in response to the test signal applied on the through channel; determine a second noise profile of a second response signal, wherein the second response signal is in response to the test signal applied on a crosstalk channel and measured on the through channel; and determine a signal-to-noise ratio of the through channel based on, at least in part, the approximate available signal voltage and the first and second noise profiles.
申请公布号 KR20140129313(A) 申请公布日期 2014.11.06
申请号 KR20147027097 申请日期 2013.03.08
申请人 INTEL CORP. 发明人 MELLITZ RICHARD;RAN ADEE
分类号 H04B3/46 主分类号 H04B3/46
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