发明名称 BEAM GRID LAYOUT
摘要 A sub-beam aperture array for forming a plurality of sub-beams from one or more charged particle beams. The sub-beam aperture array comprises one or more beam areas, each beam area comprising a plurality of sub-beam apertures arranged in a non-regular hexagonal pattern, the sub-beam apertures arranged so that, when projected in a first direction onto a li parallel to a second direction, the sub-beam apertures are uniformly spaced along the line, a wherein the first direction is different from the second direction. The system further comprises a beamlet aperture array with a plurality of beamlet apertures arranged in one or more groups. The beamlet aperture array is arranged to receive the sub-beams and form a plurality of beamlets at the locations of the beamlet apertures of the beamlet array.
申请公布号 WO2014177718(A1) 申请公布日期 2014.11.06
申请号 WO2014EP59106 申请日期 2014.05.05
申请人 MAPPER LITHOGRAPHY IP B.V. 发明人 KUIPER, VINCENT SYLVESTER;SLOT, ERWIN
分类号 H01J37/317;H01J37/09 主分类号 H01J37/317
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