发明名称 |
PRESSURE SENSITIVE SHEET FOR PROCESSING SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a pressure sensitive sheet for processing a semiconductor wafer which can be peeled easily after a dicing step in a device for sticking a dicing sheet to a wafer right after grinding of the backside of the wafer, and which allows the attachment of contaminant to be reduced remarkably.SOLUTION: A pressure sensitive sheet 20 for processing a semiconductor wafer comprises: a radiation-permeable base resin film 1; and a pressure sensitive material layer 2 provided on the base resin film. The pressure sensitive material layer is composed of a layer arranged by use of a radiation-curable resin composition. The radiation-curable resin composition includes: 100 pts.mass of a base resin including, as a primary component, a polymer (a) bonding a residue having a (meth)acrylic monomer part having a group including a radiation-curable carbon-carbon double bond to the repeating unit of the main chain; and 0.1-10 pts.mass of a photopolymerization initiator (b) of oligo{2-hydroxy-2-methyl-1-[4-(1-methyl vinyl)phenyl]propanone}(repetition number n=2-3). |
申请公布号 |
JP2014209629(A) |
申请公布日期 |
2014.11.06 |
申请号 |
JP20140098433 |
申请日期 |
2014.05.12 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
YABUKI AKIRA;YANO SHOZO;TAMAGAWA ARIMICHI |
分类号 |
H01L21/301;C09J7/02;C09J11/06;C09J133/02;C09J133/06;C09J133/14 |
主分类号 |
H01L21/301 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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