发明名称 |
SYSTEMS AND METHODS ENABLING HIGH-THROUGHPUT, REAL TIME DETECTION OF ANALYTES |
摘要 |
System and methods for detecting analytes are provided. The system includes a plasmonic interferometer with a first surface having a first and second scattering element and an aperture disposed between the first scattering element and the second scattering element. A first distance between the aperture and the first scattering element and a second distance between the aperture and the second scattering element are selected to provide interference of light at the slit. The system also includes a light source for illuminating the first surface of the plasmonic interferometer, a detector positioned for detecting light transmitted through the aperture, and a sample holder for disposing a sample to be analyzed onto the first surface of the plasmonic interferometer. |
申请公布号 |
US2014327913(A1) |
申请公布日期 |
2014.11.06 |
申请号 |
US201214350896 |
申请日期 |
2012.10.12 |
申请人 |
Brown University |
发明人 |
Pacifici Domenico;Lezec Henri J.;Palmore Tayhas G.r.;Siu Vince;Mehta Vihang;Roelke Alec;Rhieu Steve;Feng Jing |
分类号 |
G01N21/55 |
主分类号 |
G01N21/55 |
代理机构 |
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代理人 |
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主权项 |
1. A system for detecting an analyte comprising:
a plasmonic interferometer, the plasmonic interferometer comprising a first surface having a first scattering element and a second scattering element and an aperture disposed between the first scattering element and the second scattering element to define a first distance between the aperture and the first scattering element and a second distance between the aperture and the second scattering element, wherein the first and second distances are selected to provide interference of light at the aperture; a light source for illuminating the first surface of the plasmonic interferometer; a detector positioned for detecting light transmitted through the aperture; and a sample holder for disposing a sample to be analyzed onto the first surface of the plasmonic interferometer. |
地址 |
Providence RI US |