发明名称 OVER VOLTAGE PROTECTION TESTING APPARATUS
摘要 An over voltage protection testing apparatus is applied for testing an over voltage protection function of a power supply apparatus. The over voltage protection testing apparatus mainly includes a voltage boost-storage unit and an energy release unit. The voltage boost-storage unit boosts an original output voltage outputted from the power supply apparatus into a testing voltage.;Therefore, no extra testing voltage source is required for testing the over voltage protection function of the power supply apparatus. Moreover, the extra energy would be released to the energy release unit after the testing of the over voltage protection function of the power supply apparatus is finished. Therefore, the energy releasing of the present invention is faster than the energy releasing of a related art.
申请公布号 US2014327466(A1) 申请公布日期 2014.11.06
申请号 US201313875776 申请日期 2013.05.02
申请人 CHICONY POWER TECHNOLOGY CO., LTD 发明人 HUANG Chih-Ching;HUANG Jhen-Siang;HUANG Wen-Nan;LEE Shiu-Hui
分类号 G01R31/40;G01R31/28 主分类号 G01R31/40
代理机构 代理人
主权项 1. An over voltage protection testing apparatus applied to a power supply apparatus electrically connected to the over voltage protection testing apparatus, the over voltage protection testing apparatus including: a test contact electrically connected to the power supply apparatus; a voltage detecting unit electrically connected to the test contact; an energy release unit electrically connected to the test contact; a switch unit electrically connected to the test contact; a voltage boost-storage unit electrically connected to the test contact and the switch unit; and a microprocessor electrically connected to the voltage detecting unit, the energy release unit, the switch unit, and the voltage boost-storage unit, wherein the power supply apparatus outputs an original output voltage to the test contact; the voltage detecting unit is configured to detect the original output voltage and inform the microprocessor; the microprocessor is configured to record a voltage value of the original output voltage; the voltage boost-storage unit boosts the original output voltage into a testing voltage and stores the testing voltage; the microprocessor is configured to control the energy release unit and the switch unit; the energy release unit is not conducted and the power supply apparatus receives the testing voltage when the switch unit is conducted; an over voltage protection function of the power supply apparatus is tested; the voltage detecting unit is configured to detect a voltage of the test contact and inform the microprocessor; the microprocessor is informed that the power supply apparatus is turned of due to the over voltage protection function when the voltage value of the original output voltage recorded in the microprocessor minus the voltage value of the test contact is larger than a predetermined value; the energy release unit is conducted and the power supply apparatus releases energy through the energy release unit when the switch unit is not conducted.
地址 New Taipei City TW