发明名称 イオンミリング装置
摘要 PROBLEM TO BE SOLVED: To provide an ion milling apparatus in which the impact of redeposition on a cathode is suppressed while facilitating the control of an ion current under a low acceleration voltage. SOLUTION: The ion milling apparatus comprises an anode placed in an ion gun and applied with a positive voltage, and a cathode which generates ions when a potential difference is generated between the cathode and the anode. The cathode has an aperture which divides the pressure of a space to which a gas is supplied by a gas supply source, and a space on the side of a specimen irradiated with the ions, and passes the ions. An acceleration electrode for accelerating the ions passed through the aperture is also provided. COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP5618851(B2) 申请公布日期 2014.11.05
申请号 JP20110015905 申请日期 2011.01.28
申请人 发明人
分类号 H01J27/08;H01J37/09;H01J37/30 主分类号 H01J27/08
代理机构 代理人
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