| 摘要 |
<p>The reflector (5) has a non-circular arc shaped reflecting surface along a cross section, which extends in an XZ plane containing an X direction. Another non-circular arc shaped reflecting surface along another cross section, which extends in an YZ plane perpendicular to the X direction. The latter arc shaped reflecting surface defines focusing properties of the reflector within YZ plane. An Independent claim is also included for an X-ray analysis device.</p> |
