| 摘要 |
A method, system, and apparatus for non-destructively characterizing one or more regions within an ultra-hard polycrystalline structure using capacitance measurements. The apparatus includes a capacitance measuring device (410) having a positive and negative terminal (418, 419), a leached component (300) comprising a polycrystalline structure, such as a polycrystaline diamonc compact, a first wire (430), and a second wire (440). The leached component (300) includes a first surface (312) and an opposing second surface (454). The first wire (430) electrically couples the positive terminal (418) to one of the surfaces of the leached component and the second wire (440) electrically couples the negative terminal (419) to the other surface of the leached component (300). The capacitance is measured one or more times and compared to a calibration curve to determine an estimated leaching depth within the polycrystalline structure. A data scattering range is ascertained to determine a relative porosity of the polycrystalline structure or the leaching quality within the polycrystalline structure. |
