发明名称 半導体記憶装置
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor storage device capable of stable operation without margin design, independently of the design size of each transistor configuring a circuit. SOLUTION: A semiconductor storage device is provided with a memory cell 1 comprising: a D latch circuit 2 having a data input terminal D, a write enable input terminalϕ, and a data output terminal Q<SB POS="POST">-</SB>, which passes the voltage of a write data signal of the data input terminal D when a write selection signal is asserted, holds the voltage of the write data signal when the write selection signal is negated, and outputs the inverted value of the passed/held voltage from the data output terminal Q<SB POS="POST">-</SB>; and a tri-state buffer 3 connected between the data output terminal Q<SB POS="POST">-</SB>of the D latch circuit 2 and a read data line RD, which outputs the inverted value of the voltage of the data output terminal Q<SB POS="POST">-</SB>to the read data line RD when a read selection signal is asserted, and puts the output into a high-impedance state when the read selection signal is negated. COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP5617679(B2) 申请公布日期 2014.11.05
申请号 JP20110035109 申请日期 2011.02.21
申请人 发明人
分类号 G11C11/41 主分类号 G11C11/41
代理机构 代理人
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