发明名称 APPARATUS FOR TESTING A TOUCH MODULE AND METHOD THEREOF
摘要 <p>The present invention relates to an apparatus for inspecting a capacitive touch module. The inspecting apparatus comprises a board having a first surface with a plurality of grounding points formed thereon and allowing a capacitive touch module to be inspected to be disposed on the first surface thereof; a grounding unit having one end which is electrically grounded; a switch unit including a plurality of switches formed to correspond to the grounding points and disposed between the grounding points and the grounding unit; a signal input terminal unit electrically connected to an output unit of the capacitive touch module to be inspected; and a control unit controlling driving of the switches to selectively ground the grounding points, and inspecting a touch input state of the capacitive touch module by using a signal provided through the signal input terminal unit when the grounding points are selectively grounded. A touch panel of the capacitive touch module to be inspected is arranged on the first surface of the substrate.</p>
申请公布号 KR20140127531(A) 申请公布日期 2014.11.04
申请号 KR20130045964 申请日期 2013.04.25
申请人 PI SYS INC. 发明人 OH, JI WHAN;JEON, DONG WON
分类号 G01R31/28;G06F3/044 主分类号 G01R31/28
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