发明名称 Semiconductor memory device
摘要 A semiconductor memory device including a bit line, a word line, a transistor, and a capacitor is provided. The transistor includes source and drain electrodes; an oxide semiconductor film in contact with at least both top surfaces of the source and drain electrodes; a gate insulating film in contact with at least a top surface of the oxide semiconductor film; a gate electrode which overlaps with the oxide semiconductor film with the gate insulating film provided therebetween; and an insulating film covering the source and drain electrodes, the gate insulating film, and the gate electrode. The transistor is provided in a mesh of a netlike conductive film when seen from the above. Here, the drain electrode and the netlike conductive film serve as one and the other of a pair of capacitor electrodes of the capacitor. A dielectric film of the capacitor includes at least the insulating film.
申请公布号 US8878270(B2) 申请公布日期 2014.11.04
申请号 US201213443928 申请日期 2012.04.11
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Saito Toshihiko
分类号 H01L31/18;H01L49/02;H01L29/786;H01L27/02;H01L27/12;H01L21/84;H01L27/108 主分类号 H01L31/18
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. A semiconductor memory device comprising: a transistor comprising: an electrode; andan oxide semiconductor film over a top surface of the electrode, wherein the oxide semiconductor film overlaps with and is electrically connected to the electrode; a dielectric film over the electrode and the oxide semiconductor film, wherein the dielectric film is in contact with a side surface of the electrode; a conductive film over the dielectric film; a capacitor comprising: the electrode;the conductive film; andthe dielectric film between the side surface of the electrode and a side surface of the conductive film.
地址 Atsugi-shi, Kanagawa-ken JP