发明名称 |
Solid-state imaging device |
摘要 |
A purpose of the present invention is to provide a preferable separation structure of wells when a photoelectric conversion unit and a part of a peripheral circuit unit or a pixel circuit are separately formed on separate substrates and electrically connected to each other. To this end, a solid-state imaging device includes a plurality of pixels including a photoelectric conversion unit and a amplification transistor configured to amplify a signal generated by the photoelectric conversion unit; a first substrate on which a plurality of the photoelectric conversion units are disposed; and a second substrate on which a plurality of the amplification transistors are disposed. A well of a first conductivity type provided with a source region and a drain region of the amplification transistor is separated from a well, which is disposed adjacent to the well in at least one direction, of the first conductivity type provided with the source region and the drain region of the amplification transistor. |
申请公布号 |
US8878267(B2) |
申请公布日期 |
2014.11.04 |
申请号 |
US201113807207 |
申请日期 |
2011.06.27 |
申请人 |
Canon Kabushiki Kaisha |
发明人 |
Inui Fumihiro |
分类号 |
H01L31/062;H04N5/335;H01L27/146 |
主分类号 |
H01L31/062 |
代理机构 |
Canon USA, Inc. IP Division |
代理人 |
Canon USA, Inc. IP Division |
主权项 |
1. A solid-state imaging device comprising:
a plurality of pixels, each including a photoelectric conversion unit and a amplification transistor configured to amplify a signal generated by the photoelectric conversion unit; a first substrate on which the plurality of the photoelectric conversion units are disposed; and a second substrate on which the plurality of the amplification transistors are disposed, wherein a well of a first conductivity type provided with a source region and a drain region of the amplification transistor is isolated from another well of a first conductivity type which is disposed adjacent to the well in at least one direction, the another well is provided with a source region and a drain region of another amplification transistor, wherein, between the adjacent wells of the first conductivity type, by disposing a semiconductor region of a second conductivity type, the wells of the first conductivity type are isolated from each other, and wherein the semiconductor region of the second conductivity type covers a surface which is opposite to a surface on which a gate of the amplification transistor of the two wells of the first conductivity type is provided and extends to a region between the two wells of the first conductivity type. |
地址 |
Tokyo JP |