发明名称 |
Laser scanning microscope and method for operation thereof |
摘要 |
Laser scanning microscope and method for the operation thereof having at least two detection channels which has at least one beamsplitter with a splitting of the sample light deviating from the 50:50 split and/or, with 50:50 split in the detection channels, has detectors with differently adjusted gain, or in at least one detection channel with equal light splitting has an additional light attenuator. |
申请公布号 |
US8879072(B2) |
申请公布日期 |
2014.11.04 |
申请号 |
US201213413960 |
申请日期 |
2012.03.07 |
申请人 |
Carl Zeiss Microscopy GmbH |
发明人 |
Langholz Nils;Huhse Dieter |
分类号 |
G01B11/24;G01N21/64;G06T5/50;G02B21/00 |
主分类号 |
G01B11/24 |
代理机构 |
Frommer Lawrence & Haug LLP |
代理人 |
Frommer Lawrence & Haug LLP |
主权项 |
1. A method for operating a laser scanning microscope, the method comprising:
carrying out a two-dimensional horizontal image scanning in a plurality of focus positions or height positions; detecting, accordingly in a channel of each of at least two detectors, the sample light; recording three-dimensional image stacks simultaneously with the at least two detectors; splitting the sample light unequally between the at least two detectors with a color neutral beamsplitter; and calculating, for individual picture points and an associated height position, a measured intensity value of each of the two detector channels by picture point; wherein, when each of the two intensity values lies within a threshold region of the respective detector channel, a sample image is generated from the two calculated intensity values in that an average is formed between the two intensity values; wherein, when only one of the two intensity values lies within a threshold region of the respective detector channel, a sample image is generated from only one of the two intensity values; and wherein, when neither of the two intensity values lies within a threshold region of the respective detector channel, a sample image is generated using neither of the two intensity values. |
地址 |
Jena DE |