发明名称 Method and system for spectrum data analysis
摘要 A method and system for spectrum data analysis. The method comprises the steps of collecting a spectrum of an unknown material; providing a set of data templates; calculating weighting factors for the element data templates to minimize error in approximating the spectrum; removing one or more of the templates having negative weights in approximating the spectrum; and re-calculating an approximation of the spectrum with said one or more templates removed. Embodiments of the invention are suitable for analyzing noisy spectra having relatively few data points.
申请公布号 US8880356(B2) 申请公布日期 2014.11.04
申请号 US200912866697 申请日期 2009.02.06
申请人 Fei Company 发明人 Corbett Daniel Roy;Gottlieb Paul;Menzies Andrew Harley;Owen Michael James
分类号 G01N23/00;G01N23/207;H01J37/28 主分类号 G01N23/00
代理机构 Scheinberg & Associates, PC 代理人 Scheinberg & Associates, PC ;Scheinberg Michael O.;Horvath John
主权项 1. A method of spectrum data analysis, the method comprising the steps of: directing an electron beam toward an unknown material; collecting x-rays emitted from the unknown material as a result of the electron beam impact; determining from the energies of less than 100,000 collected x-rays a spectrum of the unknown material; providing a set of element data templates, each corresponding to an x-ray spectra of a chemical element; calculate least squares weights for the element data templates in approximating the spectrum; removing one or more of the templates having negative weights in approximating the spectrum; and re-calculating an approximation of the spectrum with said one or more templates removed.
地址 Hillsboro OR US