发明名称 |
Flash memory device and method for manufacturing the same |
摘要 |
The present invention provides a FinFET flash memory device and the method for manufacturing the same. The flash memory device is on an insulating layer, comprising: a first fin and a second fin, wherein the second fin is a control gate of the device; a gate dielectric layer, at side walls and top of the first fin and the second fin; source/drain regions, inside the first fin at both sides of a floating gate. |
申请公布号 |
US8878280(B2) |
申请公布日期 |
2014.11.04 |
申请号 |
US201113148265 |
申请日期 |
2011.02.24 |
申请人 |
Institute of Microelectronics, Chinese Academy of Sciences |
发明人 |
Zhu Huilong;Yin Haizhou;Luo Zhijiong |
分类号 |
H01L29/788;H01L27/115;H01L29/66;H01L21/84;H01L27/12 |
主分类号 |
H01L29/788 |
代理机构 |
Goodwin Procter LLP |
代理人 |
Goodwin Procter LLP |
主权项 |
1. A flash memory device, which is located on an insulating layer, comprising:
a first fin and a second fin, wherein the second fin is a control gate of the flash memory device, and the first fin is a flash memory channel; a gate dielectric layer located on sidewalls and on top of the first fin and the second fin; a floating gate located on the gate dielectric layer and across the first fin and the second fin; source/drain regions within the first fin which are located on two sides of the floating gate; source and drain contacts located on a contact part of the first fin; one gate contact located on a contact part of the second fin; and wherein there is only one contact which contacts the second fin. |
地址 |
Beijing CN |