发明名称 Graphene channel-based devices and methods for fabrication thereof
摘要 Graphene-channel based devices and techniques for the fabrication thereof are provided. In one aspect, a semiconductor device includes a first wafer having at least one graphene channel formed on a first substrate, a first oxide layer surrounding the graphene channel and source and drain contacts to the graphene channel that extend through the first oxide layer; and a second wafer having a CMOS device layer formed in a second substrate, a second oxide layer surrounding the CMOS device layer and a plurality of contacts to the CMOS device layer that extend through the second oxide layer, the wafers being bonded together by way of an oxide-to-oxide bond between the oxide layers. One or more of the contacts to the CMOS device layer are in contact with the source and drain contacts. One or more other of the contacts to the CMOS device layer are gate contacts for the graphene channel.
申请公布号 US8878193(B2) 申请公布日期 2014.11.04
申请号 US201313875715 申请日期 2013.05.02
申请人 International Business Machines Corporation 发明人 Avouris Phaedon;Chen Kuan-Neng;Farmer Damon;Lin Yu-Ming
分类号 H01L29/15;H01L29/16;H01L29/778;B82Y10/00;H01L29/66;H01L21/822;H01L29/786;H01L29/775;H01L27/06;H01L27/12;H01L27/092;H01L21/50;B82Y40/00 主分类号 H01L29/15
代理机构 Michael J. Chang, LLC 代理人 Alexanian Vazken;Michael J. Chang, LLC
主权项 1. A transistor device, comprising: a substrate; source and drain contacts formed on the substrate; a graphene channel formed on the substrate connecting the source and drain contacts; and a gate contact over the graphene channel, separated from the graphene channel by a dielectric, wherein the gate contact is in a non-overlapping position with the source and drain contacts leaving exposed sections of the graphene channel between the gate contact and the source and drain contacts, wherein only the exposed sections of the graphene channel are doped, and wherein the exposed sections of the graphene channel are chemically doped with an n-type or p-type dopant, and wherein the n-type or p-type dopant is present over the exposed sections of the graphene channel and also over the source and drain contacts, the gate contact, and the substrate.
地址 Armonk NY US
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