发明名称 Fin field effect transistors including energy barriers
摘要 A semiconductor device structure includes a transistor with an energy barrier beneath its transistor channel. The energy barrier prevents leakage of stored charge from the transistor channel into a bulk substrate. Methods for fabricating semiconductor devices that include energy barriers are also disclosed.
申请公布号 US8878191(B2) 申请公布日期 2014.11.04
申请号 US201213612376 申请日期 2012.09.12
申请人 Micron Technology, Inc. 发明人 Mouli Chandra V.
分类号 H01L29/15 主分类号 H01L29/15
代理机构 TraskBritt 代理人 TraskBritt
主权项 1. A fin field effect transistor, comprising: a fin including: a base comprising a protruding region of an energy barrier consisting essentially of carbonated silicon; anda top comprising semiconductor material on the base, side walls of the top substantially coplanar with side walls of the base; a gate dielectric coating at least a portion of the fin; and a gate electrode on the gate dielectric.
地址 Boise ID US