发明名称 |
Fin field effect transistors including energy barriers |
摘要 |
A semiconductor device structure includes a transistor with an energy barrier beneath its transistor channel. The energy barrier prevents leakage of stored charge from the transistor channel into a bulk substrate. Methods for fabricating semiconductor devices that include energy barriers are also disclosed. |
申请公布号 |
US8878191(B2) |
申请公布日期 |
2014.11.04 |
申请号 |
US201213612376 |
申请日期 |
2012.09.12 |
申请人 |
Micron Technology, Inc. |
发明人 |
Mouli Chandra V. |
分类号 |
H01L29/15 |
主分类号 |
H01L29/15 |
代理机构 |
TraskBritt |
代理人 |
TraskBritt |
主权项 |
1. A fin field effect transistor, comprising:
a fin including:
a base comprising a protruding region of an energy barrier consisting essentially of carbonated silicon; anda top comprising semiconductor material on the base, side walls of the top substantially coplanar with side walls of the base; a gate dielectric coating at least a portion of the fin; and a gate electrode on the gate dielectric. |
地址 |
Boise ID US |