发明名称 Silicon substrate fabrication
摘要 A method of etching a silicon substrate includes providing a silicon substrate including a first surface and a second surface. A plurality of grooves spaced apart from each other are etched from the first surface of the silicon substrate. A dielectric material is deposited on the first surface of the silicon substrate and into the plurality of grooves. A hole through the silicon substrate is etched from the second surface of the substrate to the dielectric material. A portion of the hole is located between the plurality of grooves.
申请公布号 US8877605(B1) 申请公布日期 2014.11.04
申请号 US201313860557 申请日期 2013.04.11
申请人 Eastman Kodak Company 发明人 Xie Yonglin;Ellinger Carolyn R.;Evans Mark D.;Jech, Jr. Joseph
分类号 H01L21/76;B41J2/16 主分类号 H01L21/76
代理机构 代理人 Zimmerli William R.
主权项 1. A method of etching a silicon substrate comprising: providing a silicon substrate including a first surface and a second surface; etching a plurality of grooves spaced apart from each other from the first surface of the silicon substrate, adjacent grooves of the plurality of grooves having a spacing when viewed from a direction perpendicular to the first surface of the silicon substrate; depositing a dielectric material on the first surface of the silicon substrate and into the plurality of grooves; providing a mask on the second surface of the silicon substrate that defines a dimension of interest that is smaller than the spacing between the adjacent grooves when viewed from the direction perpendicular to the first surface of the silicon substrate, and aligning the mask relative to the plurality of grooves so that the dimension of interest is between adjacent grooves; and etching a hole defined by the dimension of interest through the silicon substrate from the second surface of the substrate to the dielectric material, the hole being contained within the confines of the adjacent grooves.
地址 Rochester NY US