发明名称 Test apparatus and test method
摘要 Provided is a test apparatus that tests a device under test having a plurality of output terminals. The test apparatus comprises an executing section that executes a test command sequence for testing the device under test; a storage section that stores a plurality of pieces of setting data designating one or more output terminals among the plurality of output terminals; a detecting section that detects whether a value of an output signal from an output terminal designated by one of the pieces of setting data matches an expected value; and a selecting section that selects different pieces of setting data in the storage section when at least two detection commands, which change execution sequencing of the test command sequence according to the detection results of the detecting section, are executed, and supplies the selected pieces of setting data to the detecting section.
申请公布号 US8880375(B2) 申请公布日期 2014.11.04
申请号 US201113026160 申请日期 2011.02.11
申请人 Advantest Corporation 发明人 Kaneko Kuniyuki;Watanabe Naoyoshi
分类号 G06F19/00;G11C29/56;G11C16/04 主分类号 G06F19/00
代理机构 代理人
主权项 1. A test apparatus that tests a device under test having a plurality of output terminals, the test apparatus comprising: an executing section that executes a test command sequence for testing the device under test; a storage section that stores a plurality of pieces of setting data designating one or more output terminals among the plurality of output terminals; a detecting section that detects whether a value of an output signal from an output terminal designated by one of the pieces of setting data matches an unexpected value; and a selecting section that selects different pieces of setting data in the storage section when at least two detection commands, which change execution sequencing of the test command sequence according to detection results of the detecting section, are executed, and supplies the selected pieces of setting data to the detecting section, wherein the executing section executes detection commands that include, as operands, identification information for pieces of setting data to be supplied to the detecting section, and for each detection command execution, the selecting section selects from the storage section a piece of setting data corresponding to the identification information included in the detection command, and supplies the selected piece of setting data to the detecting section.
地址 Tokyo JP