发明名称 |
Method for manufacturing SOI substrate |
摘要 |
To suppress desorption of hydrogen ions with which a single crystal semiconductor substrate is irradiated. A method for manufacturing an SOI substrate includes the following steps: irradiating a semiconductor substrate with carbon ions; irradiating the semiconductor substrate with a hydrogen ion after the irradiation with the carbon ion so as to form an embrittled region in the semiconductor substrate; disposing a surface of the semiconductor substrate and a surface of a base substrate to face each other and to be in contact with each other so that the semiconductor substrate and the base substrate are bonded; and heating the semiconductor substrate and the base substrate which are bonded to each other and separating the semiconductor substrate along the embrittled region so that a semiconductor layer is formed over the base substrate. |
申请公布号 |
US8877607(B2) |
申请公布日期 |
2014.11.04 |
申请号 |
US201213346930 |
申请日期 |
2012.01.10 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Koezuka Junichi |
分类号 |
H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
Robinson Intellectual Property Law Office, P.C. |
代理人 |
Robinson Eric J.;Robinson Intellectual Property Law Office, P.C. |
主权项 |
1. A method for manufacturing an SOI substrate, comprising the steps of:
irradiating a semiconductor substrate with a carbon ion; irradiating the semiconductor substrate with a hydrogen ion after irradiation with the carbon ion to form an embrittled region in the semiconductor substrate; disposing a surface of the semiconductor substrate and a surface of a base substrate to face each other so that the semiconductor substrate and the base substrate are bonded; and separating the semiconductor substrate along the embrittled region to form a semiconductor layer over the base substrate, wherein a maximum value of a carbon concentration and a maximum value of a hydrogen concentration in the semiconductor substrate are located at a same depth. |
地址 |
Atsugi-shi, Kanagawa-ken JP |