发明名称 |
Display device and method for manufacturing the same |
摘要 |
An object is to provide a display device with excellent display characteristics, where a pixel circuit and a driver circuit provided over one substrate are formed using transistors which have different structures corresponding to characteristics of the respective circuits. The driver circuit portion includes a driver circuit transistor in which a gate electrode layer, a source electrode layer, and a drain electrode layer are formed using a metal film, and a channel layer is formed using an oxide semiconductor. The pixel portion includes a pixel transistor in which a gate electrode layer, a source electrode layer, and a drain electrode layer are formed using an oxide conductor, and a semiconductor layer is formed using an oxide semiconductor. The pixel transistor is formed using a light-transmitting material, and thus, a display device with higher aperture ratio can be manufactured. |
申请公布号 |
US8879011(B2) |
申请公布日期 |
2014.11.04 |
申请号 |
US201414196236 |
申请日期 |
2014.03.04 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yamazaki Shunpei;Sakata Junichiro;Tsubuku Masashi;Akimoto Kengo;Hosoba Miyuki;Sakakura Masayuki;Oikawa Yoshiaki |
分类号 |
G02F1/136;H01L29/66 |
主分类号 |
G02F1/136 |
代理机构 |
Robinson Intellectual Property Law Office, P.C. |
代理人 |
Robinson Eric J.;Robinson Intellectual Property Law Office, P.C. |
主权项 |
1. A method for manufacturing a semiconductor device, comprising the steps of:
forming an oxide semiconductor layer over an insulating layer; forming a source electrode layer and a drain electrode layer over and in contact with a first region of the oxide semiconductor layer; forming an oxide insulating layer over and in contact with a second region of the oxide semiconductor layer; and performing a heat treatment on the oxide insulating layer so that oxygen in the oxide insulating layer is supplied to the second region of the oxide semiconductor layer, wherein a conductivity of the first region of the oxide semiconductor layer is higher than a conductivity of the second region of the oxide semiconductor layer. |
地址 |
Atsugi-shi, Kanagawa-ken JP |