发明名称 Magnetic memory circuit with stress inducing layer
摘要 Memory circuit comprising an addressable magnetic tunnel junction (MTJ) stack, forming a magnetic storage element in the circuit. The MTJ stack comprises a tunnel oxide layer between a free layer and a fixed layer. A stress inducing layer is disposed adjacent to the free layer to provide tensile or compressive stress to the free layer, in order to manipulate a magnetic field that is required to write a bit into the MTJ stack. Method of using the memory circuit is also proposed.
申请公布号 US8879306(B2) 申请公布日期 2014.11.04
申请号 US201113208577 申请日期 2011.08.12
申请人 III Holdings 1, LLC 发明人 Mani Krishnakumar
分类号 G11C11/00 主分类号 G11C11/00
代理机构 McAndrews, Held & Malloy, Ltd. 代理人 McAndrews, Held & Malloy, Ltd.
主权项 1. A memory circuit comprising: a plurality of magnetic tunnel junction (MTJ) stacks forming a corresponding plurality of magnetic storage elements in the memory circuit, wherein each of the plurality of MTJ stacks includes: a tunnel oxide layer between a free layer and a fixed layer; anda stress-inducing layer disposed above the free layer, wherein: a first free layer of a first MTJ stack of the plurality of MTJ stacks is stressed to a first extent by a first stress-inducing layer of the first MTJ stack;a second free layer of a second MTJ stack of the plurality of MTJ stacks is stressed to a second extent by a second stress inducing layer of the second MTJ stack; andthe first extent and the second extent are different.
地址 Wilmington DE US