Test apparatus with physical separation feature

摘要

A test apparatus with physical separation feature is disclosed. The test apparatus includes probes (210), a peripheral circuit (220), a circuit of special function (230), wherein the peripheral circuit and the circuit of special function are separately arranged on different circuit boards (240, 250). The peripheral circuit and the circuit of special function are both electrically connected to the probes. In the test apparatus with physical separation feature, the peripheral circuit and the circuit of special function are separated in physical spaces, so that interference between the components is prevented and the testing cost is reduced.

主权项

1. A test apparatus with physical separation feature, comprising:
a first circuit board, comprising a peripheral circuit; and a second circuit board, comprising a circuit of special function, wherein the first circuit board further comprises:
a probe mount having a plurality of first probes and a plurality of second probes mounted thereon;a plurality of first probe pins, each being electrically connected to a corresponding one of the plurality of first probes for electrically connecting the corresponding first probe to the peripheral circuit; anda plurality of second probe pins, each being electrically connected to a corresponding one of the plurality of second probes for electrically connecting the corresponding second probe to the circuit of special function, wherein the plurality of first probe pins are arranged in a first arc with a center at a center of the probe mount, wherein the plurality of second probe pins are arranged in a second arc with a center at the center of the probe mount, and wherein a central angle subtended by the first arc does not overlap with a central angle subtended by the second arc.