发明名称 Nonvolatile semiconductor memory device including plural memory cells and a dummy cell coupled to an end of a memory cell
摘要 A nonvolatile semiconductor memory device having a plurality of electrically rewritable nonvolatile memory cells connected in series together includes a select gate transistor connected in series to the serial combination of memory cells. A certain one of the memory cells which is located adjacent to the select gets transistor is for use as a dummy cell. This dummy cell is not used for data storage. During data erasing, the dummy cell is applied with the same bias voltage as that for the other memory cells.
申请公布号 US8879326(B2) 申请公布日期 2014.11.04
申请号 US201313919564 申请日期 2013.06.17
申请人 Kabushiki Kaisha Toshiba 发明人 Hazama Hiroaki;Ohtani Norio
分类号 G11C11/34;G11C16/06;G11C16/10;H01L27/115;G11C16/34;G11C16/14 主分类号 G11C11/34
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A nonvolatile semiconductor memory device comprising: memory cells connected in series and having a first memory cell disposed on one end of the memory cells; a select gate transistor adjacent to the first memory cell; and a control circuit configured to apply, to the first memory cell, a different bias voltage condition from that of a second memory cell in the memory cells.
地址 Minato-ku JP