发明名称 Temperature-profiled device fingerprint generation and authentication from power-up states of static cells
摘要 A method, system and computer program product for generating device fingerprints and authenticating devices uses initial states of internal storage cells after each of a number multiple power cycles for each of a number of device temperatures to generate a device fingerprint. The device fingerprint may include pairs of expected values for each of the internal storage cells and a corresponding probability that the storage cell will assume the expected value. Storage cells that have expected values varying over the multiple temperatures may be excluded from the fingerprint. A device is authenticated by a similarity algorithm that uses a match of the expected values from a known fingerprint with power-up values from an unknown device, weighting the comparisons by the probability for each cell to compute a similarity measure.
申请公布号 US8880954(B2) 申请公布日期 2014.11.04
申请号 US201313859038 申请日期 2013.04.09
申请人 International Business Machines Corporation 发明人 Gebara Fadi H.;Kim Joonsoo;Schaub Jeremy D.;Strumpen Volker
分类号 G06F11/00;G06F21/73;G06F21/44;G11C11/41;G11C29/50;G11C16/20;G11C29/44 主分类号 G06F11/00
代理机构 Mitch Harris, Atty at Law, LLC 代理人 Mitch Harris, Atty at Law, LLC ;Harris Andrew M.;Stock William J.
主权项 1. A method for authenticating an electronic device as being a particular electronic device, wherein the electronic device contains a number of static storage elements, and wherein the method comprises: applying power to the electronic device; reading initial values of the static storage elements after applying power to collect a set of power-up states; and comparing the initial values with an identifier corresponding to the particular electronic device, wherein the identifier encodes an expected value of a set of static storage elements within the particular device and probabilities that the static storage elements will assume their corresponding expected values, and wherein the comparing applies both the expected value of the set of static storage elements and probabilities that the static storage elements will assume their corresponding expected values.
地址 Armonk NY US