发明名称 METHOD OF PRODUCING SEMICONDUCTOR DEVICE, SOLID-STATE IMAGING DEVICE, METHOD OF PRODUCING ELECTRONIC APPARATUS, AND ELECTRIC APPARATUS
摘要 <p>There is provided a method of producing a semiconductor device. The method includes the steps of: forming a first hard mask having an opening above a substrate; forming a sacrificial film above a side surface of the opening of the first hard mask; forming a second hard mask in the opening having the sacrificial film above the side surface; removing the sacrificial film after the second hard mask is formed; ion implanting a first conductivity-type impurity through the first hard mask; and ion implanting a second conductivity-type impurity through the first and second hard masks.</p>
申请公布号 KR101457382(B1) 申请公布日期 2014.11.03
申请号 KR20080076851 申请日期 2008.08.06
申请人 发明人
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
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