发明名称 Method and Apparatus for evaluating stress of the used structure
摘要 <p>A method and a device for evaluating the stress of a used structure are provided to obtain a quantized stress value based on the difference between the stress values measured by main and auxiliary stress measuring sensors, thereby measuring the stress of a used structure precisely. A device for evaluating the stress of a used structure includes a main stress measuring sensor(240), at least an auxiliary stress measuring sensor(220,260), and a stress value measuring instrument(100). The main stress measuring sensor is attached to a target portion of a used structure(10) for stress measurement. The auxiliary stress measuring sensors are respectively attached to the target portion and a portion having isostress. The stress value measuring instrument initiates measurement values of the sensors by an equal value, and obtains a stress value for the target portion based on the difference between the stress values measured by the sensors after removing the sensors from the structure.</p>
申请公布号 KR101442002(B1) 申请公布日期 2014.11.03
申请号 KR20070135755 申请日期 2007.12.21
申请人 发明人
分类号 G01L1/00;G01L1/22 主分类号 G01L1/00
代理机构 代理人
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