发明名称 METHOD FOR DIAGNOSING A VARIABLE RELUCTANCE MAGNETIC DETECTION HEAD, AND DETECTION CIRCUIT
摘要 A variable-reluctance magnetic detection head delivers an electrical signal (Uin) and a rising wavefront of the electrical signal is compared with a first threshold (Th) in order to switch from a first state (B0) to a second state (B1), and a falling wavefront is compared with a second threshold (Tb) lower than the first threshold (Th) in order to switch from the second state (B1) to the first state (B0). In a diagnostics step, the first threshold (Th) or the second threshold (Tb) is modified, bringing these thresholds closer together, and a magnetic detection head is diagnosed as being defective if the duty cycle of the second state (B1) is modified during the diagnostics step by a value higher than a diagnostics threshold predetermined in relation to a reference level.
申请公布号 US2014320116(A1) 申请公布日期 2014.10.30
申请号 US201214357675 申请日期 2012.11.09
申请人 CONTINENTAL AUTOMOTIVE FRANCE ;CONTINENTAL AUTOMOTIVE GMBH 发明人 Delcol Jean-Pierre;Desgeorge Aurore
分类号 G01R35/00;G01B7/30 主分类号 G01R35/00
代理机构 代理人
主权项 1. A diagnostics method for a variable-reluctance magnetic detection head (2) delivering an electrical signal (Uin), whereby a rising wavefront is compared with a first threshold (Th) in order to switch from a first state (B0) to a second state (B1), and a falling wavefront is compared with a second threshold (Tb) lower than the first threshold (Th) in order to switch from the second state (B1) to the first state (B0), characterized in that, in a diagnostics step, the first threshold (Th) or the second threshold (Tb) is modified, bringing these thresholds closer together, and a magnetic detection head (2) is diagnosed as being defective if the duty cycle of the second state (B1) is modified during the diagnostics step by a value higher than a diagnostics threshold (S) predetermined in relation to a reference level.
地址 Toulouse FR