| 摘要 |
<p>The invention relates to an apparatus for the three-dimensional measurement of an object, and comprises a projection system for projecting a pattern onto a surface by means of electromagnetic radiation having at least two different wavelengths or at least two different wavelength ranges; and a detector system for detecting the projected pattern at the at least two different wavelengths or at at least two different respective wavelengths from the at least two different wavelength ranges. The invention further relates to a method for the three-dimensional measurement of an object.</p> |
