INSPECTION APPARATUS AND AN INSPECTION METHOD

摘要

Detection of articles of different kind or defective quality can be accomplished with higher accuracy. With an inspection apparatus 100 and an inspection method using the inspection apparatus 100, in an analyzing unit 30, first, target pixels having imaged inspection objects are extracted from spectral data of each pixel acquired in a detecting unit 20, and the spectral data of plural target pixels which have imaged the same inspection object are grouped beforehand, and the classification of inspection objects is performed using the thus grouped spectra of the target objects. Therefore, the classification of inspection objects is done using the spectral data of a plurality of target pixels which have imaged the same inspection object. This enables reducing the possibility of incorrect judgment due to a noise contained in a specific pixel. Thus, the detection of articles of different kind or defective quality can be accomplished with higher accuracy.

主权项

1. An inspection apparatus for classifying inspection objects in an image capturing area, comprising:
a light source for emitting near-infrared light to the image capturing area; dispersing means for dispersing the light incident from the image capturing area when the near-infrared light is emitted; imaging means for outputting spectral data of each pixel by capturing a spectral image consisting of a plurality of pixels of light dispersed by the dispersing means; pixel extraction means for extracting, on the basis of the spectral data of each pixel, a target pixel to be analyzed from a plurality of pixels; spectrum calculation means for calculating the spectrum of inspection objects on the basis of spectral data of target pixels classified as belonging to a group formed by grouping a plurality of target pixels lying adjacent to each other; and a classifying means for classifying inspection objects on the basis of the spectrum computed by the spectrum calculation means.