发明名称 DESIGN SUPPORT METHOD, DESIGN SUPPORT PROGRAM, AND DESIGN SUPPORT DEVICE
摘要 PROBLEM TO BE SOLVED: To improve the fault detection accuracy.SOLUTION: A design support device 100 obtains target circuit information indicating a target circuit LOGIC. The design support device 100 selects one second flip-flop out of the second flip-flops located at an output destination of a signal of a logic circuit OR1 based on the target circuit information. The design support device 100 generates connection information indicating the connection between a data input terminal of a first flip-flop for scanning that is included in a control circuit CL and an output terminal of the selected second flip-flop SFF3. The connection information indicates the connection between an input terminal of a two-input AND circuit AND1 in the control circuit CL and a logic circuit UL2 that is an output source of a signal of a signal line TP to be controlled. The design support device 100 generates circuit information that indicates the target circuit LOGICT to which the control circuit CL is connected according to the connection information.
申请公布号 JP2014206831(A) 申请公布日期 2014.10.30
申请号 JP20130083329 申请日期 2013.04.11
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 SETOHARA YUKINORI
分类号 G06F17/50;G01R31/28;H01L21/82;H01L21/822;H01L27/04 主分类号 G06F17/50
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