发明名称 |
SEMICONDUCTOR LIGHT-EMITTING ELEMENT |
摘要 |
In a surface emission-type semiconductor light-emitting element including a DBR layer, a variation in light intensity due to a temperature change in the formation of a large number of elements manufactured from one wafer is suppressed while maintaining a light intensity enhancement effect. In the semiconductor light-emitting element that outputs emitted light having a predetermined emission peak wavelength λ, including at least a substrate 10, a lower distributed Bragg reflective layer 12 provided on the substrate 10, and a light-emitting layer 20 provided on a lower distributed Bragg reflective layer 12, the light-emitting layer 20 includes one or more sets of two active layers 22 arranged at a distance of (1+2m)λ/4n in an inactive layer 21, λ, is the emission peak wavelength, n is a refractive index of the light-emitting layer 20, and m is an integer of 0 or greater. |
申请公布号 |
US2014319571(A1) |
申请公布日期 |
2014.10.30 |
申请号 |
US201414330457 |
申请日期 |
2014.07.14 |
申请人 |
FUJIFILM Corporation |
发明人 |
HAKUTA Shinya;SONODA Shinichiro |
分类号 |
H01L33/46 |
主分类号 |
H01L33/46 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor light-emitting element that outputs emitted light having a predetermined emission peak wavelength, comprising at least:
a substrate; a lower distributed Bragg reflective layer provided on the substrate; and a light-emitting layer provided on the lower distributed Bragg reflective layer, wherein the light-emitting layer has a structure in which one or more sets of two active layers arranged at a distance of (1+2m)λ/4n are included in an inactive layer, λ is the emission peak wavelength, n is a refractive index of the light-emitting layer, and m is an integer of 0 or greater. |
地址 |
Tokyo JP |