发明名称 SEMICONDUCTOR LIGHT-EMITTING ELEMENT
摘要 In a surface emission-type semiconductor light-emitting element including a DBR layer, a variation in light intensity due to a temperature change in the formation of a large number of elements manufactured from one wafer is suppressed while maintaining a light intensity enhancement effect. In the semiconductor light-emitting element that outputs emitted light having a predetermined emission peak wavelength λ, including at least a substrate 10, a lower distributed Bragg reflective layer 12 provided on the substrate 10, and a light-emitting layer 20 provided on a lower distributed Bragg reflective layer 12, the light-emitting layer 20 includes one or more sets of two active layers 22 arranged at a distance of (1+2m)λ/4n in an inactive layer 21, λ, is the emission peak wavelength, n is a refractive index of the light-emitting layer 20, and m is an integer of 0 or greater.
申请公布号 US2014319571(A1) 申请公布日期 2014.10.30
申请号 US201414330457 申请日期 2014.07.14
申请人 FUJIFILM Corporation 发明人 HAKUTA Shinya;SONODA Shinichiro
分类号 H01L33/46 主分类号 H01L33/46
代理机构 代理人
主权项 1. A semiconductor light-emitting element that outputs emitted light having a predetermined emission peak wavelength, comprising at least: a substrate; a lower distributed Bragg reflective layer provided on the substrate; and a light-emitting layer provided on the lower distributed Bragg reflective layer, wherein the light-emitting layer has a structure in which one or more sets of two active layers arranged at a distance of (1+2m)λ/4n are included in an inactive layer, λ is the emission peak wavelength, n is a refractive index of the light-emitting layer, and m is an integer of 0 or greater.
地址 Tokyo JP