发明名称 METHODS OF FORMING BARRIER LAYERS FOR CONDUCTIVE COPPER STRUCTURES
摘要 <p>One illustrative method disclosed herein includes forming a trench/via in a layer of insulating material, forming a barrier layer in at least the trench/via, after forming said barrier layer, performing at least one process operation to introduce manganese into the barrier layer and thereby define a manganese-containing barrier layer, forming a substantially pure copper-based seed layer above the manganese-containing barrier layer, depositing a bulk copper-based material above the copper-based seed layer so as to overfill the trench/via, and removing excess materials positioned outside of the trench/via to thereby define a copper-based conductive structure.</p>
申请公布号 SG2014004899(A) 申请公布日期 2014.10.30
申请号 SG20140004899 申请日期 2014.01.21
申请人 GLOBALFOUNDRIES INC. 发明人 BERND HINTZE;FRANK KOSCHINSKY
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