发明名称 OXIDE SEMICONDUCTOR FILM AND PROCESS OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To improve crystallinity of an oxide semiconductor and to provide a crystalline oxide semiconductor film having a region crystallized at an under-layer interface or nearby and to provide a process of manufacturing the same.SOLUTION: An oxide semiconductor film containing indium, gallium, and zinc is formed. The oxide semiconductor film is heated by irradiating an energy beam. The oxide semiconductor film contains micro-crystals or a crystalline region oriented in c-axis.
申请公布号 JP2014207442(A) 申请公布日期 2014.10.30
申请号 JP20140053040 申请日期 2014.03.17
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SHIMOMURA AKIHISA;ISHIYAMA TAKAHISA;FURUYAMA MASAKI;KIKUCHI ERM;HIROHASHI TAKUYA;OTA MASASHI
分类号 H01L21/20;H01L21/336;H01L21/428;H01L29/786 主分类号 H01L21/20
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