发明名称 |
OXIDE SEMICONDUCTOR FILM AND PROCESS OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To improve crystallinity of an oxide semiconductor and to provide a crystalline oxide semiconductor film having a region crystallized at an under-layer interface or nearby and to provide a process of manufacturing the same.SOLUTION: An oxide semiconductor film containing indium, gallium, and zinc is formed. The oxide semiconductor film is heated by irradiating an energy beam. The oxide semiconductor film contains micro-crystals or a crystalline region oriented in c-axis. |
申请公布号 |
JP2014207442(A) |
申请公布日期 |
2014.10.30 |
申请号 |
JP20140053040 |
申请日期 |
2014.03.17 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
SHIMOMURA AKIHISA;ISHIYAMA TAKAHISA;FURUYAMA MASAKI;KIKUCHI ERM;HIROHASHI TAKUYA;OTA MASASHI |
分类号 |
H01L21/20;H01L21/336;H01L21/428;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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