发明名称 Shape Measuring Apparatus
摘要 A shape measuring apparatus (1) measures a workpiece shape utilizing white light interference, and includes a stage (10) on which a workpiece (W) is placed, an interference optical system (100) that irradiates the workpiece (W) with white light (WL) to generate a white light interference moire, a drive unit (26) that moves one of the stage and the interference optical system in a direction of an optical axis, a length measuring device (50) that measures a relative distance (L) between the stage and the interference optical system changed by the drive unit, and an imaging unit (40) that images the white light interference moire to acquire contrast information of the white light interference moire that changes according to the relative distance.
申请公布号 US2014320866(A1) 申请公布日期 2014.10.30
申请号 US201214364048 申请日期 2012.09.12
申请人 KONICA MINOLTA, INC. 发明人 Mikoshiba Hironobu;Takitani Toshiya
分类号 G01B11/25;G01B11/24 主分类号 G01B11/25
代理机构 代理人
主权项 1. A shape measuring apparatus that measures a workpiece shape by using white light interference, the apparatus comprising: a stage on which the workpiece is placed; an interference optical system that irradiates the workpiece with white light to thereby generate a white light interference moire; a drive unit that moves a position of one of the stage and the interference optical system in a direction of an optical axis; a length measuring device that measures a relative distance between the stage and the interference optical system, the relative distance being changed by the drive unit upon moving the stage or the interference optical system; and an imaging unit that images the white light interference moire to acquire contrast information of the white light interference moire that changes according to the relative distance.
地址 Chiyoda-ku JP