发明名称 SEMICONDUCTOR PROCESSING SYSTEM WITH SOURCE FOR DECOUPLED ION AND RADICAL CONTROL
摘要 <p>A top plate assembly is positioned above and spaced apart from the substrate support, such that a processing region exists between the top plate assembly and the substrate support. The top plate assembly includes a central plasma generation microchamber and a plurality of annular-shaped plasma generation microchambers positioned in a concentric manner about the central plasma generation microchamber. Adjacently positioned ones of the central and annular-shaped plasma generation microchambers are spaced apart from each other so as to form a number of axial exhaust vents therebetween. Each of the central and annular-shaped plasma generation microchambers is defined to generate a corresponding plasma therein and supply reactive constituents of its plasma to the processing region between the top plate assembly and the substrate support.</p>
申请公布号 SG11201402690T(A) 申请公布日期 2014.10.30
申请号 SGT11201402690 申请日期 2012.12.04
申请人 LAM RESEARCH CORPORATION 发明人 KOSHIISHI, AKIRA;VENTZEK, PETER, L.G.;SHINAGAWA, JUN;HOLLAND, JOHN, PATRICK
分类号 H01B13/00 主分类号 H01B13/00
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