发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a semiconductor device with a treated member, includes: subjecting an adhesive support having a substrate and an adhesive layer capable of increasing or decreasing in adhesiveness upon irradiation with an actinic ray or radiation to pattern exposure of the adhesive layer to provide a high adhesive region and a low adhesive region in the adhesive layer, adhering a first surface of a to-be-treated member to the adhesive layer of the adhesive support, applying a mechanical or chemical treatment to a second surface different from the first surface of the to-be-treated member to obtain a treated member, and detaching the first surface of the treated member from the adhesive layer of the adhesive support. |
申请公布号 |
US2014318697(A1) |
申请公布日期 |
2014.10.30 |
申请号 |
US201414328191 |
申请日期 |
2014.07.10 |
申请人 |
FUJIFILM Corporation |
发明人 |
TAN Shiro;FUJIMAKI Kazuhiro;NAKAMURA Atsushi;IWAI Yu;KOYAMA Ichiro |
分类号 |
H01L21/673 |
主分类号 |
H01L21/673 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor device with a treated member, comprising:
subjecting an adhesive support having a substrate and an adhesive layer capable of increasing or decreasing in adhesiveness upon irradiation with an actinic ray or radiation to pattern exposure of the adhesive layer to provide a high adhesive region and a low adhesive region in the adhesive layer, adhering a first surface of a to-be-treated member to the adhesive layer of the adhesive support, applying a mechanical or chemical treatment to a second surface different from the first surface of the to-be-treated member to obtain a treated member, and detaching the first surface of the treated member from the adhesive layer of the adhesive support. |
地址 |
Tokyo JP |