发明名称 チップLED検査装置
摘要 <p>The invention provides a detection device capable of accurately detecting opaque materials that are located at sealed resin portions of chip LEDs. The detection device comprises a support member 5 for supporting a chip LED 50; an upper illuminating mechanism 10 for illuminating the surface of the chip LED 50; a camera for shooting images of the surface of the chip LED 50; and a determining portion 8 for making an analysis of the shot images and determining whether foreign matters exist. The upper illuminating mechanism 10 is composed of a first illuminating portion and a second illuminating portion, wherein the first illuminating portion has a dome-shaped body and a plurality of light sources configured in the dome-shaped body and indirectly illuminates the part therebelow through lights that are emitted downwardly from an opening portion below the dome-shaped body, and the second illuminating portion has an annular body and a plurality of light sources configured below the annular body and directly illuminates the part therebelow through lights that are emitted by the light sources. The camera 6 is configured above the first illuminating portion to shoot images of the surface of the chip LED 50 through a shooting-purpose opening portion.</p>
申请公布号 JP5615604(B2) 申请公布日期 2014.10.29
申请号 JP20100148551 申请日期 2010.06.30
申请人 发明人
分类号 G01N21/95;G01N21/84;H01L33/00 主分类号 G01N21/95
代理机构 代理人
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