发明名称 チャンク多結晶シリコン及び多結晶シリコンチャンクをクリーニングする方法
摘要 Polycrystalline silicon fracture-piece with 0.5-35 ppbw carbon concentration on the surface, is claimed. An independent claim is also included for cleaning the polycrystalline silicon fracture-piece having carbon contamination on the surface, comprising carrying out thermal treatment of the polycrystalline silicon fracture-piece in a reactor at 350-600[deg] C under an inert gas atmosphere, where the polycrystalline silicon fracture-piece after the thermal treatment has 0.5-35 ppbw carbon concentration on the surface.
申请公布号 JP5615946(B2) 申请公布日期 2014.10.29
申请号 JP20130012903 申请日期 2013.01.28
申请人 发明人
分类号 C01B33/02;C01B33/037 主分类号 C01B33/02
代理机构 代理人
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