| 摘要 |
<p>The present invention relates to a handler for testing a semiconductor device which can support a test of a semiconductor device. The handler for testing a semiconductor device senses an exposure time for which a test socket of a socket plate is exposed to a camera during movement of a device feeder by a sensor and photographs the test socket (feeding point from which a semiconductor device is fed) by a camera at the corresponding time. According to the handler of the present invention, it can be determined whether the semiconductor device remains on the test socket without interfering with the movement of the device feeder in a normal work path, thereby improving processing efficiency.</p> |
