发明名称 RF SHIELDED TEST CHAMBER
摘要 <p>The present invention relates to an RF shielded test chamber. The test chamber includes: a chamber frame forming a chamber space of the test chamber and covering the same; and a chamber door provided to open or close the test chamber from the front edge side of the test chamber, attached on the chamber frame by hinge structure. The chamber door includes a side surface forming parts of the side surface of test chamber, either on front wall or edge of a door, as an extended body of the side surface included in the test chamber by the chamber frame from the vertical direction of the test chamber. The hinge structure between the chamber frame and chamber door is practically attached on the side surface of the chamber frame by a horizontal joint structure. The hinge structure is arranged to guide the chamber door to move up and down from the up-lift location of the chamber door against the chamber frame.</p>
申请公布号 KR20140125699(A) 申请公布日期 2014.10.29
申请号 KR20130055081 申请日期 2013.05.15
申请人 PKC ELECTRONICS OY 发明人 RANTAKUPARI TAPIO;LEPPAEKARI JANNE
分类号 G01R29/08;G01R31/28 主分类号 G01R29/08
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