发明名称 半導体装置およびその製造方法
摘要 <p>Provided is a semiconductor device including, on the same semiconductor substrate, a transistor element, a capacitor, and a resistor. The capacitor is formed on an active region, and the resistor is formed on an element isolation region, both formed of the same polysilicon film. By CMP or etch-back, the surface is ground down while planarizing the surface until a resistor has a desired thickness. Owing to a difference in height between the active region and the element isolation region, a thin resistor and a thick upper electrode of the capacitor are formed to prevent passing through of a contact.</p>
申请公布号 JP5616823(B2) 申请公布日期 2014.10.29
申请号 JP20110050242 申请日期 2011.03.08
申请人 发明人
分类号 H01L21/822;H01L27/04 主分类号 H01L21/822
代理机构 代理人
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