| 摘要 |
The measuring system (1) has a magnetic field sensor arrangement (10), which has a first magnetic field sensor (11) integrated in a semiconductor chip for measuring a first component (Bx) of a magnetic field vector (B) in a first spatial direction (x) and a second magnetic field sensor (12) integrated in the semiconductor chip for measuring a second component (Bz) of the magnetic field vector in a second spatial direction (z). A third magnetic field sensor (13) is integrated in the semiconductor chip for measuring a third component (By) of magnetic field vector in third spatial direction (y). |
