发明名称 SEMICONDUCTOR DEVICE
摘要 <p>A MOSFET (1) includes: a substrate (10) having a trench (19) formed therein and made of silicon carbide, the trench (19) being opened on one main surface (10A) side and having a side wall surface (19A); a gate insulating film (21) formed on the side wall surface (19A) in contact therewith; and a gate electrode (23) formed on the gate insulating film (21) in contact therewith, wherein a square region with each side of 100 nm in the side wall surface (19A) has a surface roughness of not more than 1.0 nm in RMS.</p>
申请公布号 EP2797118(A1) 申请公布日期 2014.10.29
申请号 EP20120859841 申请日期 2012.10.12
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 MASUDA, TAKEYOSHI
分类号 H01L29/78;H01L21/336;H01L29/12;H01L29/423 主分类号 H01L29/78
代理机构 代理人
主权项
地址