发明名称 半導体装置の製造方法
摘要 <p>In a method of manufacturing a semiconductor device, a barrier metal film and an aluminum metal film are formed on an insulating film on a semiconductor substrate. Two aluminum electrodes are formed in parallel with each other by patterning the barrier metal film and the aluminum metal film. The aluminum metal film in a region of part of each of the two aluminum electrodes are selectively removed to form two single-layer barrier metal electrodes separated from each other. A resistor is formed between the two single-layer barrier metal electrodes so as to electrically connect the two single-layer barrier metal electrodes to each other.</p>
申请公布号 JP5616822(B2) 申请公布日期 2014.10.29
申请号 JP20110046807 申请日期 2011.03.03
申请人 发明人
分类号 H01L21/822;H01L21/768;H01L23/522;H01L27/04 主分类号 H01L21/822
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