发明名称 SENSOR FOR MEASURING SURFACE NON-UNIFORMITY
摘要 <p>A method includes forming a two-dimensional interrogating beam on a selected sample region of a surface; collecting light transmitted through or reflected from the sample region with an array of lenses to form a sample array of focus spots; imaging the sample array of focus spots through an imaging lens on a sensor; and comparing an image of the sample array of focus spots to a reference array of focus spots to determine a level of non-uniformity in the sample region.</p>
申请公布号 EP2795250(A1) 申请公布日期 2014.10.29
申请号 EP20120860619 申请日期 2012.12.11
申请人 3M INNOVATIVE PROPERTIES COMPANY 发明人 QIAO, YI;LAI, JACK W.;RIBNICK, EVAN J.;HOFELDT, DAVID L.
分类号 G01B11/30;G01N21/86;G01N21/88;G01N21/89;G01N21/95 主分类号 G01B11/30
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