发明名称 Nonvolatile memory device including sudden power off detection circuit and sudden power off detection method thereof
摘要 A nonvolatile memory device includes a memory cell array comprising memory cells connected to bit lines and word lines; a word line decoder configured to apply word line voltages to the word lines; a bit line selector configured to select at least one bit line of the bit lines; a control logic configured to control the word line decoder and the bit line selector so that write data is programmed in the memory cell array; and a sudden power off (SPO) detection circuit, wherein the SPO detection circuit comprises: a sensing cell; a first driver configured to provide a first voltage to the sensing cell; and a second driver configured to provide a second voltage to the sensing cell, wherein a program state of the sensing cell becomes different depending on an order or a time difference between the first driver and the second driver being powered off.
申请公布号 US8873328(B2) 申请公布日期 2014.10.28
申请号 US201314037544 申请日期 2013.09.26
申请人 Samsung Electronics Co., Ltd. 发明人 Shin Yong Shik;Yang Yunseok;Kwon Oh-Seong
分类号 G11C11/00;G11C11/14;G11C5/14;G11C11/16 主分类号 G11C11/00
代理机构 Muir Patent Consulting, PLLC 代理人 Muir Patent Consulting, PLLC
主权项 1. A nonvolatile memory device comprising: a memory cell array comprising a plurality of memory cells connected to a plurality of bit lines and a plurality of word lines; a word line decoder configured to apply word line voltages to the plurality of word lines; a bit line selector configured to select at least one bit line of the plurality of bit lines; a control logic configured to control the word line decoder and the bit line selector so that write data is programmed in the memory cell array; and a sudden power off (SPO) detection circuit, wherein the SPO detection circuit comprises: a sensing cell; a first driver configured to provide a first voltage to the sensing cell; and a second driver configured to provide a second voltage to the sensing cell, wherein a program state of the sensing cell becomes different depending on an order or a time difference between the first driver and the second driver being powered off.
地址 Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do KR