发明名称 |
Reverse construction integrated circuit |
摘要 |
A method of fabricating a memory cell comprises forming a plurality of doped semiconductor layers on a carrier substrate. The method further comprises forming a plurality of digit lines separated by an insulating material. The digit lines are arrayed over the doped semiconductor layers. The method further comprises etching a plurality of trenches into the doped semiconductor layers. The method further comprises depositing an insulating material into the plurality of trenches to form a plurality of electrically isolated transistor pillars. The method further comprises bonding at least a portion of the structure formed on the carrier substrate to a host substrate. The method further comprises separating the carrier substrate from the host substrate. |
申请公布号 |
US8871588(B2) |
申请公布日期 |
2014.10.28 |
申请号 |
US201213475716 |
申请日期 |
2012.05.18 |
申请人 |
Micron Technology, Inc. |
发明人 |
Wells David H.;Manning H. Montgomery |
分类号 |
H01L21/8242;H01L21/762;H01L21/84;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
Knobbe Martens Olson & Bear LLP |
代理人 |
Knobbe Martens Olson & Bear LLP |
主权项 |
1. A method comprising:
forming patterned conductive lines for access devices over semiconductor material on a carrier substrate; forming a plurality of storage devices over at least some of the patterned conductive lines; after forming the patterned conductive lines and the plurality of storage devices, placing at least the patterned conductive lines on a host substrate; and removing at least a portion of the carrier substrate. |
地址 |
Boise ID US |