发明名称 Reverse construction integrated circuit
摘要 A method of fabricating a memory cell comprises forming a plurality of doped semiconductor layers on a carrier substrate. The method further comprises forming a plurality of digit lines separated by an insulating material. The digit lines are arrayed over the doped semiconductor layers. The method further comprises etching a plurality of trenches into the doped semiconductor layers. The method further comprises depositing an insulating material into the plurality of trenches to form a plurality of electrically isolated transistor pillars. The method further comprises bonding at least a portion of the structure formed on the carrier substrate to a host substrate. The method further comprises separating the carrier substrate from the host substrate.
申请公布号 US8871588(B2) 申请公布日期 2014.10.28
申请号 US201213475716 申请日期 2012.05.18
申请人 Micron Technology, Inc. 发明人 Wells David H.;Manning H. Montgomery
分类号 H01L21/8242;H01L21/762;H01L21/84;H01L27/108 主分类号 H01L21/8242
代理机构 Knobbe Martens Olson & Bear LLP 代理人 Knobbe Martens Olson & Bear LLP
主权项 1. A method comprising: forming patterned conductive lines for access devices over semiconductor material on a carrier substrate; forming a plurality of storage devices over at least some of the patterned conductive lines; after forming the patterned conductive lines and the plurality of storage devices, placing at least the patterned conductive lines on a host substrate; and removing at least a portion of the carrier substrate.
地址 Boise ID US